Dieses Dokument steht unter einer CreativeCommons Lizenz by/3.0
Verlagslink DOI: 10.1088/0960-1317/26/3/035010
Titel: Enhanced DySEM imaging of cantilever motion using artificial structures patterned by focused ion beam techniques
Sprache: English
Autor/Autorin: Schröter, Maria-Astrid 
Ritter, Martin 
Holschneider, Matthias 
Sturm, Heinz 
Schlagwörter: FIB patterning;structured cantilever;AFM;modal analysis;DySEM
Erscheinungsdatum: 4-Feb-2016
Verlag: IOP
Quellenangabe: Journal of Micromechanics and Microengineering 3 (26): 035010- (2016-02-04)
Zeitschrift oder Schriftenreihe: Journal of micromechanics and microengineering 
Zusammenfassung (englisch): We use a dynamic scanning electron microscope (DySEM) to map the spatial distribution of the vibration of a cantilever beam. The DySEM measurements are based on variations of the local secondary electron signal within the imaging electron beam diameter during an oscillation period of the cantilever. For this reason, the surface of a cantilever without topography or material variation does not allow any conclusions about the spatial distribution of vibration due to a lack of dynamic contrast. In order to overcome this limitation, artificial structures were added at defined positions on the cantilever surface using focused ion beam lithography patterning. The DySEM signal of such high-contrast structures is strongly improved, hence information about the surface vibration becomes accessible. Simulations of images of the vibrating cantilever have also been performed. The results of the simulation are in good agreement with the experimental images.
URI: http://tubdok.tub.tuhh.de/handle/11420/1880
DOI: 10.15480/882.1877
ISSN: 1361-6439
Institut: Betriebseinheit Elektronenmikroskopie M-26 
Dokumenttyp: (wissenschaftlicher) Artikel
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