Titel: Analyzing the quality of carbon nanotube dispersions in polymers using scanning electron microscopy
Sprache: Englisch
Autor/Autorin: Lott, Josef-Zoltan
Andresen, Kjer
Pauls, Jan Roman
Pardo Garcia, Claudia
Schossig, Michael
Schulte, Karl
Bauhofer, Wolfgang
Schlagwörter: Carbon Nanotubes;Resins;Scanning Electron Microscopy;Electrical Properties
Erscheinungsdatum: 2007
Quellenangabe: Carbon (2007), doi:10.1016/j.carbon.2007.01.012
Zusammenfassung (englisch): The ability to examine conducting filler particles in an insulating polymer matrix by scanning electron microscopy (SEM) was investigated. The detection of selected secondary electrons is necessary to resolve sub-micron scale filler particles, but not every SEM detector seems to be able to monitor the small changes introduced by the conducting filler particles. The influence of SEM parameters and the challenge of image interpretation in view of the apparent lack of appropriate information in literature are discussed. In accordance with other experiments on light element samples, all monitored electrons seem to be emitted within approximately 50 nm of the sample depth and no information is accessible from deeper regions even by increasing the acceleration voltage.
URI: http://tubdok.tub.tuhh.de/handle/11420/269
URN: urn:nbn:de:gbv:830-tubdok-3365
DOI: 10.15480/882.267
Institut: Optische und Elektronische Materialien E-12
Optical and Electronic Materials E-12 (Materials in Electrical Engineering and Optics)
Dokumenttyp: Preprint (Vorabdruck)
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